M

Mr. Dubey • 53.50K Points
Coach

Q. In this iterative test generation method, sequential logic is

(A) used in the same pattern
(B) converted to test logic
(C) converted to combinational logic
(D) converted to asynchronous logic
Share

Explanation by: Mr. Dubey
 in this iterative test generation method, the main approach of testing is sequential logic is converted into combinational logic by cutting the feedback lines, thus creating pesudo inputs and outputs.

You must be Logged in to update hint/solution

Discusssion

Login to discuss.

Loading Comments....

Question analytics