M

Mr. Dubey • 52.26K Points
Coach

Q. Mottling due to X ray diffraction can be identified by:

(A) Noting a large change between two successive exposures with the test piece rotated slightly about the beam axis
(B) Noting a slight change between two successive exposures with the test piece rotated slightly about the beam axis
(C) Noting a characteristic pattern corresponding to the lattice spacing
(D) None of the above
Correct : Option (B)

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