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Dear candidates you will find MCQ questions of Digital Principles and System Design here. Learn these questions and prepare yourself for coming examinations and interviews. You can check the right answer of any question by clicking on any option or by clicking view answer button.

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Mr. Dubey • 51.17K Points
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Q. 151) A user doesn’t want to use the IF statement for detecting clock edge. It is possible to do the same by using any other keyword in VHDL.

(A) true
(B) false
(C) ---
(D) ---
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Mr. Dubey • 51.17K Points
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Q. 152) Sequential circuits are represented as

(A) finite state machine
(B) infinite state machine
(C) finite synchronous circuit
(D) infinite asynchronous circuit
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Mr. Dubey • 51.17K Points
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Q. 153) Sequential circuit includes

(A) delays
(B) feedback
(C) delays and feedback from input to output
(D) delays and feedback from output to input
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Mr. Dubey • 51.17K Points
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Q. 154) Which constitutes the test vectors in sequential circuits?

(A) feedback variables
(B) delay factors
(C) test patterns
(D) all input combinations
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Mr. Dubey • 51.17K Points
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Q. 155) Outputs are functions of

(A) present state
(B) previous state
(C) next state
(D) present and next state
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Mr. Dubey • 51.17K Points
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Q. 156) Which is the delay elements for clocked system?

(A) and gates
(B) or gates
(C) flip-flops
(D) multiplexers
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Mr. Dubey • 51.17K Points
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Q. 157) Which contributes to the necessary delay element?

(A) flip-flops
(B) circuit propagation elements
(C) negative feedback path
(D) shift registers
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Mr. Dubey • 51.17K Points
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Q. 158) In an OR gate, if A and B are two inputs and there is struck at 1 fault in B path, then output will be

(A) a
(B) 0
(C) 1
(D) b’
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Mr. Dubey • 51.17K Points
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Q. 159) Iterative test generation method suits for circuits with

(A) no feedback loops
(B) few feedback loops
(C) more feedback loops
(D) negative feedback loops only
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Mr. Dubey • 51.17K Points
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Q. 160) Which method is very time consuming?

(A) d-algorithm
(B) iterative test generation
(C) pseudo exhaustive method
(D) test generation pattern
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